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Editorial Team
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| Editor Larry Wasserman, Carnegie Mellon University |
| Editorial Assistant Heidi Rhodes |
| Associate Editor Felix Abramovich |
| Associate Editor Anestis Antoniadis, University Joseph Fourier |
| Associate Editor David Banks |
| Associate Editor Yannick Baraud, Laboratoire J.A. Dieudonné, UNSA |
| Associate Editor Gilles Blanchard, Fraunhofer FIRST, Berlin |
| Associate Editor Anthony Brockwell |
| Associate Editor Florentina Bunea, FSU |
| Associate Editor Raymond J. Carroll, Texas A&M University |
| Associate Editor Andrew Carter, UC Santa Barbara |
| Associate Editor Ngai Hang Chan |
| Associate Editor Helmut Finner |
| Associate Editor Christopher Genovese |
| Associate Editor Subhashis Ghosal, North Carolina State University |
| Associate Editor Richard David Gill, Leiden University, and Eurandom |
| Associate Editor Hemant Ishwaran |
| Associate Editor Keith Knight, University of Toronto |
| Associate Editor Michael R Kosorok, University of North Carolina-Chapel Hill |
| Associate Editor John Lafferty, Carnegie Mellon University |
| Associate Editor Domenico Marinucci, Department of Mathematics, University of Rome Tor Vergata |
| Associate Editor Steve Marron |
| Associate Editor Peter McCullagh |
| Associate Editor Rob McCulloch |
| Associate Editor Nicolai Meinshausen, University of Oxford |
| Associate Editor Per Mykland |
| Associate Editor Andrew Nobel |
| Associate Editor Marianna Pensky, University of Central Florida |
| Associate Editor Kathryn Roeder |
| Associate Editor Jeffrey S. Rosenthal, University of Toronto |
| Associate Editor David Ruppert |
| Associate Editor Chad Schafer |
| Associate Editor Xiaotong Shen |
| Associate Editor Rob Strawderman, Cornell University |
| Associate Editor Jiayang Sun |
| Associate Editor Alexandre Tsybakov |
| Associate Editor Mark van der Laan |
| Associate Editor Matt Wand |
| Associate Editor Marten H Wegkamp, Florida State University |
Names are linked to email addresses and biographical statements, if provided.
Electronic Journal of Statistics. ISSN: 1935-7524